220-380nm T50:R50 UV Beamsplitter

220-380nm UV beamsplitter transmit 50% and reflect 50% of the UV light. Coligh customs and manufactures UV laser beamsplitter plate for various applications.

220-380nm T50:R50 UV Beamsplitter Overview

This 220–380 nm broadband UV plate beamsplitter is specifically designed for optical systems requiring uniform beam splitting across the full UVC and UVA spectral range. It features a 50:50 broadband dielectric beamsplitting coating on a fused silica substrate and a broadband anti-reflective coating on the back surface, ensuring that the energy of the transmitted and reflected beams is approximately equal (50% each) within the 220–380 nm range. The beamsplitter is suitable for applications involving long-term exposure to high-intensity light sources, such as deuterium lamps and UV lasers.

The spectrum Curve Of 220-380nm T50:R50 UV Beamsplitter

220 380nm 50 50 UV beamsplitter 1 -

220-380nm T50:R50 UV Beamsplitter Technical Specifcation

  • Beamsplitter wavelength: 220-380nm
  • Transmission and reflection: 50:50+/-10%
  • Material: Fused silica
  • Angle of incidence: 45deg
  • Size: 80*80*1.0.7mm or custom
  • AR coating: Back side
  • Thin film coating: Dielectric hard coating

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Customization Capability of UV Laser Beamsplitter

220-380nm T50:R50 UV Beamsplitter Applications

Dual-beam UV-Vis spectrophotometer.

In water quality analysis and biochemical protein concentration detection, the output intensity of broadband UV light sources (such as deuterium lamps) fluctuates slightly due to changes in time and temperature. Without real-time compensation for light source intensity across the 220–380 nm detection range, instrument baseline drift occurs, leading to measurement inaccuracies at trace concentration levels. A 220–380 nm beamsplitter can eliminate system errors caused by light source instability.

UV fluorescence microscope.

Observing internal cellular structures requires the use of various fluorescent dyes. A 220–380 nm broadband UV beamsplitter accommodates multiple UV excitation sources, enabling coaxial illumination and observation, as well as the excitation of diverse biomolecules using a broadband UV light source.

Semiconductor wafer defect inspection.

266 nm and 355 nm are common UV laser wavelengths used in semiconductor inspection and micro/nano-fabrication. A 220–380 nm broadband UV beamsplitter can reflect 1%–5% of the UV laser energy to a power meter for real-time closed-loop control of the laser’s output power, while allowing more than 95% of the energy to be transmitted to the workpiece.

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